Determination of defect content and defect profile in semiconductor heterostructures
- Zubiaga, A.
- Garcia, A.
- Plazaola, F.
- Z̃iga-Pérez, J.
- Mũoz-Sanjosé, V.
ISSN: 1742-6596, 1742-6588
Année de publication: 2011
Volumen: 265
Número: 1
Type: Communication dans un congrès