New method for the determination of the defect profile in thin layers grown over a substrate
- Zubiaga, A.
- García, J.A.
- Plazaola, F.
- Tuomisto, F.
- Zúñiga, J.
- Muñoz-Sanjosé, V.
ISSN: 1862-6351
Année de publication: 2007
Volumen: 4
Número: 10
Pages: 3973-3976
Type: Communication dans un congrès