Post-implantation annealing of SiC studied by slow-positron spectroscopies
- Brauer, G.
- Anwand, W.
- Coleman, P.G.
- Störmer, J.
- Plazaola, F.
- Campillo, J.M.
- Pacaud, Y.
- Skorupa, W.
ISSN: 0953-8984
Année de publication: 1998
Volumen: 10
Número: 5
Pages: 1147-1156
Type: Article