Critical fluctuations in epidemic models explain COVID-19 post-lockdown dynamics
- Aguiar, M.
- Van-Dierdonck, J.B.
- Mar, J.
- Cusimano, N.
- Knopoff, D.
- Anam, V.
- Stollenwerk, N.
Journal:
Scientific Reports
ISSN: 2045-2322
Year of publication: 2021
Volume: 11
Issue: 1
Type: Article