Positron annihilation spectroscopy for the determination of thickness and defect profile in thin semiconductor layers

  1. Zubiaga, A.
  2. García, J.A.
  3. Plazaola, F.
  4. Tuomisto, F.
  5. Zúñiga-Pérez, J.
  6. Muñoz-Sanjosé, V.
Revue:
Physical Review B - Condensed Matter and Materials Physics

ISSN: 1098-0121,  1550-235X

Année de publication: 2007

Volumen: 75

Número: 20

Type: Article

DOI: 10.1103/PHYSREVB.75.205305 GOOGLE SCHOLAR

Objectifs de Développement Durable

La source de données: Scopus