Demystifying Defects: Federated Learning and Explainable AI for Semiconductor Fault Detection

1. Patel, T.
2. Murugan, R.
3. Yenduri, G.
4. Jhaveri, R.H.
5. Snoussi, H.
6. Gaber, T.

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DOI: 10.1109/ACCESS.2024.3425226 GOOGLE SCHOLAR lock_openOpen access editor

Data source: Scopus