Demystifying Defects: Federated Learning and Explainable AI for Semiconductor Fault Detection

  1. Patel, T.
  2. Murugan, R.
  3. Yenduri, G.
  4. Jhaveri, R.H.
  5. Snoussi, H.
  6. Gaber, T.
Aldizkaria:
IEEE Access

ISSN: 2169-3536

Argitalpen urtea: 2024

Alea: 12

Orrialdeak: 116987-117007

Mota: Artikulua

DOI: 10.1109/ACCESS.2024.3425226 GOOGLE SCHOLAR lock_openSarbide irekia editor
Datuen iturria: Scopus