Demystifying Defects: Federated Learning and Explainable AI for Semiconductor Fault Detection

  1. Patel, T.
  2. Murugan, R.
  3. Yenduri, G.
  4. Jhaveri, R.H.
  5. Snoussi, H.
  6. Gaber, T.
Revue:
IEEE Access

ISSN: 2169-3536

Année de publication: 2024

Volumen: 12

Pages: 116987-117007

Type: Article

DOI: 10.1109/ACCESS.2024.3425226 GOOGLE SCHOLAR lock_openAccès ouvert editor
La source de données: Scopus